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1

The huang hilbert transform for evaluating the instantaneous frequency evolution of transient signals in non-linear systems

Baccigalupi, Aldo, Liccardo, Annalisa

Journal:

Year:

2016

Language:

english

File:

PDF, 3.88 MB

english, 2016

2

Low-Cost Prototype for the Electronically Compensation of Current Transformers

Baccigalupi, Aldo, Liccardo, Annalisa

Journal:

IEEE Sensors Journal

Year:

2009

Language:

english

File:

PDF, 657 KB

english, 2009

3

Testing high resolution DACs: A contribution to draft standard IEEE P1658

Aldo Baccigalupi, Mauro D’Arco, Annalisa Liccardo, Michele Vadursi

Journal:

Year:

2011

Language:

english

File:

PDF, 790 KB

english, 2011

4

A nonlinearity test method for scan conversion-based transient digitizers

Pasquale Arpaia, Aldo Baccigalupi, Pasquale Daponte

Journal:

Year:

1997

Language:

english

File:

PDF, 734 KB

english, 1997

5

A methodology for testing immunity of field programmable analog arrays to radiated electromagnetic field

Aldo Baccigalupi, Annalisa Liccardo, Nicola Pasquino

Journal:

Year:

2011

Language:

english

File:

PDF, 1.02 MB

english, 2011

6

Compressive sampling-based strategy for enhancing ADCs resolution

Baccigalupi, Aldo, D’Arco, Mauro, Liccardo, Annalisa, Schiano Lo Moriello, Rosario

Journal:

Year:

2014

Language:

english

File:

PDF, 568 KB

english, 2014

7

Baccigalupi, Aldo, Liccardo, Annalisa

Journal:

IEEE Sensors Journal

Year:

2007

Language:

english

File:

PDF, 617 KB

english, 2007

8

[IEEE 2011 IEEE International Workshop on Measurements and Networking Proceedings - Anacapri, Italy (2011.10.10-2011.10.11)] 2011 IEEE International Workshop on Measurements and Networking Proceedings (M&N) - Web-based networking protocol for expanding IEEE-488 ATE capabilities

Baccigalupi, Aldo, Cesaro, Umberto, D'Arco, Mauro, Liccardo, Annalisa

Year:

2011

Language:

english

File:

PDF, 835 KB

english, 2011

9

[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Functional tests of field programmable analog arrays under the influence of electromagnetic radiation

Baccigalupi, Aldo, Liccardo, Annalisa, Lo Sapio, Vittorio, Pasquino, Nicola

Year:

2010

Language:

english

File:

PDF, 1.01 MB

english, 2010

10

[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Problems arising in the experimental evaluation of DACs dynamic parameters

Baccigalupi, Aldo, D'Arco, Mauro, Liccardo, Annalisa, Vadursi, Michele

Year:

2010

Language:

english

File:

PDF, 710 KB

english, 2010

11

Parameters and Methods for ADCs Testing Compliant With the Guide to the Expression of Uncertainty in Measurements

Baccigalupi, Aldo, DArco, Mauro, Liccardo, Annalisa

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2017

Language:

english

File:

PDF, 1.30 MB

english, 2017

12

[IEEE 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Torino, Italy (2017.5.22-2017.5.25)] 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Evaluating the uncertainty of dynamic signals sampled by ADCs

Baccigalupi, Aldo, D'Arco, Mauro, Liccardo, Annalisa

Year:

2017

Language:

english

File:

PDF, 423 KB

english, 2017

13

Evaluating the Uncertainty of Digitizing Waveform Recorders Coherently With the GUM

Baccigalupi, Aldo, D'Arco, Mauro, Liccardo, Annalisa

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2018

Language:

english

File:

PDF, 1.99 MB

english, 2018

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